2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT). IEEE.
Chicago Style (17th ed.) Citation2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT). IEEE.
MLA (8th ed.) Citation2016 International Symposium on VLSI Design, Automation and Test (VLSI-DAT). IEEE.
Warning: These citations may not always be 100% accurate.