Cita APA (7th ed.)

2010 International Conference on Microelectronic Test Structures (ICMTS). IEEE.

Cita Chicago (17th ed.)

2010 International Conference on Microelectronic Test Structures (ICMTS). IEEE.

Cita MLA (8th ed.)

2010 International Conference on Microelectronic Test Structures (ICMTS). IEEE.

Atenció: Aquestes cites poden no estar 100% correctes.