2016 20th International Symposium on VLSI Design and Test (VDAT)

2016 20th International Symposium on VLSI Design and Test (VDAT)

Bibliographic Details
Format:	Electronic Book
Language:	English
Published:	IEEE
Subjects:	Communication, Networking and Broadcast Technologies; Components, Circuits, Devices and Systems; Engineered Materials, Dielectrics and Plasmas; Photonics and Electrooptics; Power, Energy and Industry Applications; Robotics and Control Systems; Signal Processing and Analysis Conference papers and proceedings.
Online Access:	Full text available on IEEE [2017-2023] Off-campus access
Classic Catalogue:	View this record in Classic Catalogue

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