2010 IEEE International Conference on Computational Intelligence for Measurement Systems and Applications
| Format: | Electrònic Llibre |
|---|---|
| Idioma: | English |
| Publicat: |
IEEE
|
| Matèries: | |
| Accés en línia: | Full text available on IEEE [2017-2023] Off-campus access |
| Classic Catalogue: | View this record in Classic Catalogue |