2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems

2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems

Бібліографічні деталі
Формат:	Електронний ресурс Книга
Мова:	English
Опубліковано:	IEEE
Предмети:	Power, Energy and Industry Applications; Aerospace; Bioengineering; Communication, Networking and Broadcast Technologies; Components, Circuits, Devices and Systems; Computing and Processing; Robotics and Control Systems; Transportation; Signal Processing and Analysis; Engineered Materials, Dielectrics and Plasmas; Fields, Waves and Electromagnetics Conference papers and proceedings.
Онлайн доступ:	Full text available on IEEE [2017-2023] Off-campus access
Classic Catalogue:	View this record in Classic Catalogue

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