2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems

2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems

Bibliografiske detaljer
Format: Electronisk Bog
Sprog:English
Udgivet: IEEE
Fag:
Power, Energy and Industry Applications; Aerospace; Bioengineering; Communication, Networking and Broadcast Technologies; Components, Circuits, Devices and Systems; Computing and Processing; Robotics and Control Systems; Transportation; Signal Processing and Analysis; Engineered Materials, Dielectrics and Plasmas; Fields, Waves and Electromagnetics
Conference papers and proceedings.
Online adgang:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue

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Full text available on IEEE [2017-2023]
Off-campus access

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