Cita APA (7th ed.)

2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT). IEEE.

Cita Chicago (17th ed.)

2013 International Symposium OnVLSI Design, Automation, and Test (VLSI-DAT). IEEE.

Cita MLA (8th ed.)

2013 International Symposium OnVLSI Design, Automation, and Test (VLSI-DAT). IEEE.

Atenció: Aquestes cites poden no estar 100% correctes.