2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Dettagli Bibliografici
Natura:	Elettronico Libro
Lingua:	English
Pubblicazione:	IEEE
Soggetti:	Communication, Networking and Broadcast Technologies; Components, Circuits, Devices and Systems; Computing and Processing Conference papers and proceedings.
Accesso online:	Full text available on IEEE [2017-2023] Off-campus access
Classic Catalogue:	View this record in Classic Catalogue

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