VLSI Test Symposium
| Format: | Electronic Book |
|---|---|
| Language: | English |
| Published: |
IEEE
|
| Subjects: | |
| Online Access: | Full text available on IEEE [2017-2023] Off-campus access |
| Classic Catalogue: | View this record in Classic Catalogue |
| Item Description: | <strong>Off-Campus Access:</strong> Athens ID and Password Required <strong>On-Campus Access:</strong> No User ID or Password Required |
|---|---|
| Physical Description: | 1 online resource |
| Format: | Mode of access: Internet |
| ISBN: | 1093-0167 2375-1053 |
| Access: | Electronic access restricted to authorized BRAC University faculty, staff and students |