System Modeling & Advancement in Research Trends (SMART), International Conference

System Modeling & Advancement in Research Trends (SMART), International Conference

Détails bibliographiques
Format: Électronique Livre
Langue:English
Publié: IEEE
Sujets:
Communication, Networking and Broadcast Technologies; Components, Circuits, Devices and Systems; Computing and Processing; Engineering Profession; General Topics for Engineers; Geoscience; Signal Processing and Analysis
Conference papers and proceedings.
Accès en ligne:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue

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