Proceedings of Technical Program of 2012 VLSI Design, Automation and Test. IEEE.
Chicago Style (17th ed.) CitationProceedings of Technical Program of 2012 VLSI Design, Automation and Test. IEEE.
MLA (8th ed.) CitationProceedings of Technical Program of 2012 VLSI Design, Automation and Test. IEEE.
Warning: These citations may not always be 100% accurate.