Proceedings of 2011 International Symposium on VLSI Design, Automation and Test. IEEE.
Chicago Style (17th ed.) CitationProceedings of 2011 International Symposium on VLSI Design, Automation and Test. IEEE.
MLA引文Proceedings of 2011 International Symposium on VLSI Design, Automation and Test. IEEE.
警告:這些引文格式不一定是100%准確.