Nondestructive Evaluation/Testing: New Technology & Application (FENDT), Far East Forum on

Nondestructive Evaluation/Testing: New Technology & Application (FENDT), Far East Forum on

Bibliografiske detaljer
Format: Electronisk Bog
Sprog:English
Udgivet: IEEE
Fag:
Components, Circuits, Devices and Systems; Computing and Processing; Engineered Materials, Dielectrics and Plasmas; Engineering Profession; Fields, Waves and Electromagnetics; Photonics and Electrooptics; Robotics and Control Systems; Signal Processing and Analysis
Conference papers and proceedings.
Online adgang:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue

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