Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), IEEE International Conference on

Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), IEEE International Conference on

Bibliographische Detailangaben
Format:	Elektronisch Buch
Sprache:	English
Veröffentlicht:	IEEE
Schlagworte:	Bioengineering; Components, Circuits, Devices and Systems; Computing and Processing; General Topics for Engineers; Photonics and Electrooptics; Robotics and Control Systems; Signal Processing and Analysis Conference papers and proceedings.
Online Zugang:	Full text available on IEEE [2017-2023] Off-campus access
Classic Catalogue:	View this record in Classic Catalogue

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