Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), IEEE International Conference on

Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), IEEE International Conference on

Dettagli Bibliografici
Natura: Elettronico Libro
Lingua:English
Pubblicazione: IEEE
Soggetti:
Bioengineering; Components, Circuits, Devices and Systems; Computing and Processing; General Topics for Engineers; Photonics and Electrooptics; Robotics and Control Systems; Signal Processing and Analysis
Conference papers and proceedings.
Accesso online:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue

Accesso online

Full text available on IEEE [2017-2023]
Off-campus access

Documenti analoghi