2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems

Detalles Bibliográficos
Formato: Electrónico Libro
Idioma:English
Publicado: IEEE
Subjects:
Acceso en liña:Full text available on IEEE [2017-2023]
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Classic Catalogue: View this record in Classic Catalogue

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