2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH)

2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH)

Bibliografische gegevens
Formaat: Elektronisch Boek
Taal:English
Gepubliceerd in: IEEE
Onderwerpen:
Power, Energy and Industry Applications; Communication, Networking and Broadcast Technologies; Components, Circuits, Devices and Systems; Engineered Materials, Dielectrics and Plasmas; Signal Processing and Analysis
Conference papers and proceedings.
Online toegang:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue
Omschrijving
Beschrijving item:<strong>Off-Campus Access:</strong> Athens ID and Password Required
<strong>On-Campus Access:</strong> No User ID or Password Required
Fysieke beschrijving:1 online resource
Formaat:Mode of access: Internet
ISBN:978-1-4244-8343-3
978-1-4244-8344-0
Toegang:Electronic access restricted to authorized BRAC University faculty, staff and students

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