2011 Symposium on Design, Test, Integration & Packaging of MEMS/MOEMS (DTIP)

Détails bibliographiques
Format: Électronique Livre
Langue:English
Publié: IEEE
Sujets:
Accès en ligne:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue
Description
Description:<strong>Off-Campus Access:</strong> Athens ID and Password Required
<strong>On-Campus Access:</strong> No User ID or Password Required
Description matérielle:1 online resource
Format:Mode of access: Internet
ISBN:978-1-61284-905-8
978-2-35500-015-7
Accès:Electronic access restricted to authorized BRAC University faculty, staff and students