APA-referens (7:e uppl.)

Deep Learning for Testing and Testing for Deep Learning (DeepTest), IEEE/ACM Third International Workshop on. IEEE.

Chicago-referens (17:e uppl.)

Deep Learning for Testing and Testing for Deep Learning (DeepTest), IEEE/ACM Third International Workshop on. IEEE.

MLA-referens (8:e uppl.)

Deep Learning for Testing and Testing for Deep Learning (DeepTest), IEEE/ACM Third International Workshop on. IEEE.

Varning: dessa hänvisningar är inte alltid fullständigt riktiga.