Control, Measurement and Instrumentation (CMI), IEEE International Conference on
| Format: | Electronisk Bog |
|---|---|
| Sprog: | English |
| Udgivet: |
IEEE
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| Fag: | |
| Online adgang: | Full text available on IEEE [2017-2023] Off-campus access |
| Classic Catalogue: | View this record in Classic Catalogue |
Lignende værker
- 2016 IEEE First International Conference on Control, Measurement and Instrumentation (CMI)
- 2021 IEEE Second International Conference on Control, Measurement and Instrumentation (CMI)
- 2020 13th CMI Conference on Cybersecurity and Privacy (CMI) - Digital Transformation - Potentials and Challenges(51275)
- 2014 IEEE 32nd VLSI Test Symposium (VTS)
- Nanotechnology in Instrumentation and Measurement (NANOFIM)