Computational Intelligence and Virtual Environments for Measurement Systems and Applications, IEEE International Conference on. IEEE.
Chicago Style (17th ed.) CitationComputational Intelligence and Virtual Environments for Measurement Systems and Applications, IEEE International Conference on. IEEE.
MLA (8th ed.) CitationComputational Intelligence and Virtual Environments for Measurement Systems and Applications, IEEE International Conference on. IEEE.
Warning: These citations may not always be 100% accurate.