2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
| स्वरूप: | इलेक्ट्रोनिक पुस्तक |
|---|---|
| भाषा: | English |
| प्रकाशित: |
IEEE
|
| विषय: | |
| ऑनलाइन पहुंच: | Full text available on IEEE [2017-2023] Off-campus access |
| Classic Catalogue: | View this record in Classic Catalogue |
समान संसाधन
- Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), IEEE International Conference on
- 2022 IEEE Workshop on Metrology for Agriculture and Forestry (MetroAgriFor)
- 2022 IEEE International Workshop on Metrology for Automotive (MetroAutomotive)
- 2016 IEEE Metrology for Aerospace (MetroAeroSpace)
- 2015 IEEE Metrology for Aerospace (MetroAeroSpace)