2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

التفاصيل البيبلوغرافية
التنسيق:	الكتروني كتاب
اللغة:	English
منشور في:	IEEE
الموضوعات:	Bioengineering; Components, Circuits, Devices and Systems; Computing and Processing; General Topics for Engineers; Photonics and Electrooptics; Robotics and Control Systems; Signal Processing and Analysis Conference papers and proceedings.
الوصول للمادة أونلاين:	Full text available on IEEE [2017-2023] Off-campus access
Classic Catalogue:	View this record in Classic Catalogue

مواد مشابهة