2018 IEEE Workshop on Monitoring and Testing of Cyber-Physical Systems (MT-CPS)

Bibliographic Details
Format: Electronic Book
Language:English
Published: IEEE
Subjects:
Online Access:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue
Description
Item Description:<strong>Off-Campus Access:</strong> Athens ID and Password Required
<strong>On-Campus Access:</strong> No User ID or Password Required
Physical Description:1 online resource
Format:Mode of access: Internet
ISBN:978-1-5386-6748-4
978-1-5386-6749-1
Access:Electronic access restricted to authorized BRAC University faculty, staff and students