2011 12th Intl. Conf. on Thermal, Mechanical & Multi-Physics Simulation and Experiments in Microelectronics and Microsystems

Bibliographische Detailangaben
Format: Elektronisch Buch
Sprache:English
Veröffentlicht: IEEE
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Online Zugang:Full text available on IEEE [2017-2023]
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Beschreibung:1 online resource
Format:Mode of access: Internet
ISBN:978-1-4577-0106-1
978-1-4577-0107-8
Zugangseinschränkungen:Electronic access restricted to authorized BRAC University faculty, staff and students