2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS)

Detalles Bibliográficos
Formato: Electrónico Libro
Idioma:English
Publicado: IEEE
Subjects:
Acceso en liña:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue
Descripción
descrición da copia:<strong>Off-Campus Access:</strong> Athens ID and Password Required
<strong>On-Campus Access:</strong> No User ID or Password Required
Descrición Física:1 online resource
Formato:Mode of access: Internet
ISBN:978-1-5386-4238-2
978-1-5386-4239-9
Acceso:Electronic access restricted to authorized BRAC University faculty, staff and students