2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS). IEEE.
Chicago Style (17th ed.) Citation2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS). IEEE.
ציטוט MLA2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS). IEEE.
אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.