Cita APA (7th ed.)

2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS). IEEE.

Cita Chicago (17th ed.)

2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS). IEEE.

Cita MLA (8th ed.)

2018 3rd International Conference on Pattern Analysis and Intelligent Systems (PAIS). IEEE.

Atenció: Aquestes cites poden no estar 100% correctes.