2010 Symposium on Design Test Integration and Packaging of MEMS/MOEMS (DTIP). IEEE.
Chicago Style (17th ed.) Citation2010 Symposium on Design Test Integration and Packaging of MEMS/MOEMS (DTIP). IEEE.
MLA (8th ed.) Citation2010 Symposium on Design Test Integration and Packaging of MEMS/MOEMS (DTIP). IEEE.
Warning: These citations may not always be 100% accurate.