2010 11th International Workshop on Microprocessor Test and Verification

2010 11th International Workshop on Microprocessor Test and Verification

Dades bibliogràfiques
Format:	Electrònic Llibre
Idioma:	English
Publicat:	IEEE
Matèries:	Components, Circuits, Devices and Systems; Computing and Processing; Communication, Networking and Broadcast Technologies; Engineered Materials, Dielectrics and Plasmas Conference papers and proceedings.
Accés en línia:	Full text available on IEEE [2017-2023] Off-campus access
Classic Catalogue:	View this record in Classic Catalogue

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