2017 IEEE International Conference on Software Quality, Reliability and Security (QRS)

Bibliografische gegevens
Formaat: Elektronisch Boek
Taal:English
Gepubliceerd in: IEEE
Onderwerpen:
Online toegang:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue
Omschrijving
Beschrijving item:<strong>Off-Campus Access:</strong> Athens ID and Password Required
<strong>On-Campus Access:</strong> No User ID or Password Required
Fysieke beschrijving:1 online resource
Formaat:Mode of access: Internet
ISBN:978-1-5386-0592-9
978-1-5386-0593-6
Toegang:Electronic access restricted to authorized BRAC University faculty, staff and students