2017 IEEE International Conference on Software Quality, Reliability and Security (QRS)
| Format: | Électronique Livre |
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| Langue: | English |
| Publié: |
IEEE
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| Sujets: | |
| Accès en ligne: | Full text available on IEEE [2017-2023] Off-campus access |
| Classic Catalogue: | View this record in Classic Catalogue |
| Description: | <strong>Off-Campus Access:</strong> Athens ID and Password Required <strong>On-Campus Access:</strong> No User ID or Password Required |
|---|---|
| Description matérielle: | 1 online resource |
| Format: | Mode of access: Internet |
| ISBN: | 978-1-5386-0592-9 978-1-5386-0593-6 |
| Accès: | Electronic access restricted to authorized BRAC University faculty, staff and students |