2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

Manylion Llyfryddiaeth
Fformat: Electronig Llyfr
Iaith:English
Cyhoeddwyd: IEEE
Pynciau:
Aerospace; Bioengineering; Components, Circuits, Devices and Systems; Computing and Processing; Engineered Materials, Dielectrics and Plasmas; Fields, Waves and Electromagnetics; General Topics for Engineers; Photonics and Electrooptics; Power, Energy and Industry Applications; Robotics and Control Systems; Signal Processing and Analysis
Conference papers and proceedings.
Mynediad Ar-lein:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue

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