2017 IEEE Conference on Visual Analytics Science and Technology (VAST)

Sonraí bibleagrafaíochta
Formáid: Leictreonach LEABHAR
Teanga:English
Foilsithe / Cruthaithe: IEEE
Ábhair:
Rochtain ar líne:Full text available on IEEE [2017-2023]
Off-campus access
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Cur síos
Cur síos ar an mír:<strong>Off-Campus Access:</strong> Athens ID and Password Required
<strong>On-Campus Access:</strong> No User ID or Password Required
Cur síos fisiciúil:1 online resource
Formáid:Mode of access: Internet
ISBN:978-1-5386-3163-8
978-1-5386-3164-5
Rochtain:Electronic access restricted to authorized BRAC University faculty, staff and students