Prospects of graphene and carbon nanotube for nanoscale interconnects

This thesis report is submitted in partial fulfilment of the requirements for the degree of Bachelor of Science in Electrical and Electronic Engineering, 2017.

Бібліографічні деталі
Автори: Rayhan, Md. Shakhawat Hossain, Uddin, Md. Shifat, Biva, Jannatul Tazrin, Huda, Md. Shofiqul
Інші автори: Haque, Anamul
Формат: Дисертація
Мова:English
Опубліковано: BRAC University 2018
Предмети:
Онлайн доступ:http://hdl.handle.net/10361/9126
id 10361-9126
record_format dspace
institution Brac University
collection Institutional Repository
language English
topic Graphene
Carbon Nanotube
Nanoscale
RC delay
Electromigration
Integrated circuit
spellingShingle Graphene
Carbon Nanotube
Nanoscale
RC delay
Electromigration
Integrated circuit
Rayhan, Md. Shakhawat Hossain
Uddin, Md. Shifat
Biva, Jannatul Tazrin
Huda, Md. Shofiqul
Prospects of graphene and carbon nanotube for nanoscale interconnects
description This thesis report is submitted in partial fulfilment of the requirements for the degree of Bachelor of Science in Electrical and Electronic Engineering, 2017.
author2 Haque, Anamul
author_facet Haque, Anamul
Rayhan, Md. Shakhawat Hossain
Uddin, Md. Shifat
Biva, Jannatul Tazrin
Huda, Md. Shofiqul
format Thesis
author Rayhan, Md. Shakhawat Hossain
Uddin, Md. Shifat
Biva, Jannatul Tazrin
Huda, Md. Shofiqul
author_sort Rayhan, Md. Shakhawat Hossain
title Prospects of graphene and carbon nanotube for nanoscale interconnects
title_short Prospects of graphene and carbon nanotube for nanoscale interconnects
title_full Prospects of graphene and carbon nanotube for nanoscale interconnects
title_fullStr Prospects of graphene and carbon nanotube for nanoscale interconnects
title_full_unstemmed Prospects of graphene and carbon nanotube for nanoscale interconnects
title_sort prospects of graphene and carbon nanotube for nanoscale interconnects
publisher BRAC University
publishDate 2018
url http://hdl.handle.net/10361/9126
work_keys_str_mv AT rayhanmdshakhawathossain prospectsofgrapheneandcarbonnanotubefornanoscaleinterconnects
AT uddinmdshifat prospectsofgrapheneandcarbonnanotubefornanoscaleinterconnects
AT bivajannatultazrin prospectsofgrapheneandcarbonnanotubefornanoscaleinterconnects
AT hudamdshofiqul prospectsofgrapheneandcarbonnanotubefornanoscaleinterconnects
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spelling 10361-91262023-01-23T09:01:10Z Prospects of graphene and carbon nanotube for nanoscale interconnects Rayhan, Md. Shakhawat Hossain Uddin, Md. Shifat Biva, Jannatul Tazrin Huda, Md. Shofiqul Haque, Anamul Department of Electrical and Electronic Engineering, BRAC University Graphene Carbon Nanotube Nanoscale RC delay Electromigration Integrated circuit This thesis report is submitted in partial fulfilment of the requirements for the degree of Bachelor of Science in Electrical and Electronic Engineering, 2017. Cataloged from PDF version of thesis. Includes bibliographical references (page 53-60). Interconnects are the channels that provide power and carry signals between various components on an integrated circuit. As technology is shrinking to nano scale the thickness of the interconnect wire is also decreasing. Currently, copper (Cu) is being used as interconnect material but with the scaling in nanometer regime, it exhibits much difficulties in terms of IC performance and reliability. Which is the bottleneck for improving IC performance in future. When the thickness of the copper wire reduces to 41nm its resistivity becomes approximately 1.5 times of the bulk resistivity[56]. When this thickness is 10nm the resistivity is infinite. Not only this to keep pace with the current technology node of interconnets a large amount of current has to flow within a very thick wire. for this reason the wire has to withstand with a high current density. But copper at nanometer range only sustain in 106A/cm2[81] of current densities with some structural defects. Also in this current density copper wire exhibits very high joule heating consequently degrades the IC’s performance. Progressively high curent density leads to electromigration faliure which degrades wire life time. As a result IC lose its longevity. To tackle this challenges and difficulties faced by copper wires it is high time to think of another material which can be used as interconnect for future devices. The new material have to have sustainability in nanoscale with higher breakdown current density, Elecromigration antagonist and joule heating preventive which leads to high performance IC’s. Also the new material need to be reliable which makes the interconnect lifetime higher. In this paper we are proposing two new material named graphene and carbon nanotube(CNT) which can be the effective replacement of copper. Graphene and CNT can be implemented in nanoscale interonnects for their magical characteristics. Both of this material have nanoscale physical configuaration. Graphene has low resistivity (1u cm)[72] is even lower compared to other good conductor like silver (1.5u cm). Not only this CNT’s and Graphene can withstand current densities up to 109A/cm2[81] which make them electromigration antagonist. But The only challenge for graphene is schottkey barrier it creates at the junction of the metal and semiconductor which causes a barrier height for electron to pass through. Another compound mixing where the barrier height is less can solve the problem of graphene. If this issue is resolved, we may then directly use Graphene and CNT for nano scale interconnects. This paper extensively illustrates why Graphene and CNT can be the best alternative for replacing copper. In the beginning of the paper different kinds of interconnect has been described. Later that the paper delivers a comprehensive review of the previous, existing materials used for interconnects v and then described the new materials for interconnects. The paper also elaborates the major limitations of copper in nanoscale interconnects and then successfully delineate the major advantages we may get from graphene and carbon nanotube as interconnect material. After that the production route of graphene has been described. In this dissertation we tried to establish the major issues of copper and the best alternative for that. Further study is needed for the capping material of graphene which will increase the lifetime of the interconnect. Md. Shakhawat Hossain Rayhan Md. Shifat Uddin Jannatul Tazrin Biva Md. Shofiqul Huda B. Electrical and Electronic Engineering  2018-01-22T05:38:41Z 2018-01-22T05:38:41Z 2017 2017-12 Thesis ID 13121089 ID 14121015 ID 14121010 ID 14121001 http://hdl.handle.net/10361/9126 en BRAC University thesis is protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. 60 pages application/pdf BRAC University