Mixed FBB and RBB low leakage technique for high durable CMOS circuit

Mixed FBB and RBB low leakage technique for high durable CMOS circuit

This conference paper was presented in the 2014 International Conference on Informatics, Electronics and Vision, ICIEV 2014; Dhaka; Bangladesh; 23 May 2014 through 24 May 2014 [© 2014 IEEE Computer Society] The conference paper's definite version is available at: http://10.1109/ICIEV.2014.6850...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों: Barua, Parag, Jafar, Imran Bin, Sengupta, Prianka, Noor, Md Sadaf
अन्य लेखक: Department of Electrical and Electronic Engineering
स्वरूप: Conference Paper
भाषा:English
प्रकाशित: © 2014 IEEE Computer Society 2016
विषय:
BB-Back Bias
CMOS Circuits
FBB-Forward Back Bias
Gate leakage
Leakage current
Low leakage
Low Power VLSI
RBBReverse Back Bias
Tunneling current
ऑनलाइन पहुंच:http://hdl.handle.net/10361/7035

इंटरनेट

http://hdl.handle.net/10361/7035

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