Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming

This internship report is submitted in partial fulfillment of the requirements for the degree of Bachelor of Applied Physics and Electronics, 2019.

Chi tiết về thư mục
Tác giả chính:	Mustafa, Anjum
Tác giả khác:	Rahman, Muhammad Lutfor
Định dạng:	Internship report
Ngôn ngữ:	English
Được phát hành:	Brac University 2019
Những chủ đề:	Keihley 2450 IV characteristic curve Source Meter source measure unit Resistor Semiconductor lasers.
Truy cập trực tuyến:	http://hdl.handle.net/10361/12424

id	10361-12424
record_format	dspace
spelling	10361-124242019-09-30T05:51:03Z Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming Mustafa, Anjum Rahman, Muhammad Lutfor Department of Mathematics and Natural Sciences, Brac University Keihley 2450 IV characteristic curve Source Meter source measure unit Resistor Semiconductor lasers. This internship report is submitted in partial fulfillment of the requirements for the degree of Bachelor of Applied Physics and Electronics, 2019. Cataloged from PDF version of internship report. Includes bibliographical references (page 18). This internship report mainly focuses on Investigating the IV characteristic curve of diode and resistor using Keihley 2450 source meter operated by lab view programming. Using the Lab view programming such configuration was made where voltage is supplied and the corresponding current had been calculated for several points for both diode and resistor. A voltage versus Current graph was plotted using Origin lab according to the data from the setup and was investigated and compared with the theoretical properties of the diode and resistor with authentic reference. The measured data followed the theory and almost gave the same characteristic curves which proves that the programming in Labview and the setup in Keithley 2450 source meter was accurate for the measurement. Anjum Mustafa B. Applied Physics and Electronics 2019-07-25T04:34:30Z 2019-07-25T04:34:30Z 2019 2019 Internship report ID 14215001 http://hdl.handle.net/10361/12424 en Brac University Internship reports are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. 18 pages application/pdf Brac University
institution	Brac University
collection	Institutional Repository
language	English
topic	Keihley 2450 IV characteristic curve Source Meter source measure unit Resistor Semiconductor lasers.
spellingShingle	Keihley 2450 IV characteristic curve Source Meter source measure unit Resistor Semiconductor lasers. Mustafa, Anjum Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming
description	This internship report is submitted in partial fulfillment of the requirements for the degree of Bachelor of Applied Physics and Electronics, 2019.
author2	Rahman, Muhammad Lutfor
author_facet	Rahman, Muhammad Lutfor Mustafa, Anjum
format	Internship report
author	Mustafa, Anjum
author_sort	Mustafa, Anjum
title	Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming
title_short	Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming
title_full	Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming
title_fullStr	Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming
title_full_unstemmed	Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming
title_sort	investigation of iv characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming
publisher	Brac University
publishDate	2019
url	http://hdl.handle.net/10361/12424
work_keys_str_mv	AT mustafaanjum investigationofivcharacteristicofsemiconductordiodeandresistorusingkeithley2450sourcemeteroperatedbylabviewprogramming
_version_	1814309352984543232

Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming

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