Mustafa, A., & Rahman, M. L. (2019). Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming. Brac University.
Citação norma ChicagoMustafa, Anjum, and Muhammad Lutfor Rahman. Investigation of IV Characteristic of Semiconductor Diode and Resistor Using Keithley 2450 Source Meter Operated by Labview Programming. Brac University, 2019.
Citação norma MLAMustafa, Anjum, and Muhammad Lutfor Rahman. Investigation of IV Characteristic of Semiconductor Diode and Resistor Using Keithley 2450 Source Meter Operated by Labview Programming. Brac University, 2019.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.