Mustafa, A., & Rahman, M. L. (2019). Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming. Brac University.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रMustafa, Anjum, और Muhammad Lutfor Rahman. Investigation of IV Characteristic of Semiconductor Diode and Resistor Using Keithley 2450 Source Meter Operated by Labview Programming. Brac University, 2019.
एमएलए (8वां संस्करण) प्रशस्ति पत्रMustafa, Anjum, और Muhammad Lutfor Rahman. Investigation of IV Characteristic of Semiconductor Diode and Resistor Using Keithley 2450 Source Meter Operated by Labview Programming. Brac University, 2019.
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