Mustafa, A., & Rahman, M. L. (2019). Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming. Brac University.
Chicago-Zitierstil (17. Ausg.)Mustafa, Anjum, und Muhammad Lutfor Rahman. Investigation of IV Characteristic of Semiconductor Diode and Resistor Using Keithley 2450 Source Meter Operated by Labview Programming. Brac University, 2019.
MLA-Zitierstil (8. Ausg.)Mustafa, Anjum, und Muhammad Lutfor Rahman. Investigation of IV Characteristic of Semiconductor Diode and Resistor Using Keithley 2450 Source Meter Operated by Labview Programming. Brac University, 2019.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.