Mustafa, A., & Rahman, M. L. (2019). Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming. Brac University.
Dyfyniad Arddull ChicagoMustafa, Anjum, and Muhammad Lutfor Rahman. Investigation of IV Characteristic of Semiconductor Diode and Resistor Using Keithley 2450 Source Meter Operated by Labview Programming. Brac University, 2019.
Dyfyniad MLAMustafa, Anjum, and Muhammad Lutfor Rahman. Investigation of IV Characteristic of Semiconductor Diode and Resistor Using Keithley 2450 Source Meter Operated by Labview Programming. Brac University, 2019.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.