Mustafa, A., & Rahman, M. L. (2019). Investigation of IV characteristic of semiconductor diode and resistor using keithley 2450 source meter operated by labview programming. Brac University.
توثيق أسلوب شيكاغو (الطبعة السابعة عشر)Mustafa, Anjum, و Muhammad Lutfor Rahman. Investigation of IV Characteristic of Semiconductor Diode and Resistor Using Keithley 2450 Source Meter Operated by Labview Programming. Brac University, 2019.
توثيق جمعية اللغة المعاصرة MLA (الطبعة الثامنة)Mustafa, Anjum, و Muhammad Lutfor Rahman. Investigation of IV Characteristic of Semiconductor Diode and Resistor Using Keithley 2450 Source Meter Operated by Labview Programming. Brac University, 2019.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.