APA (7 ম সংস্করণ) উদ্ধৃতি

Kullberg, R. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

শিকাগো স্টাইল (17 তম সংস্করণ) উদ্ধৃতি

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.

M.L.A (8 ম সংস্করণ) উদ্ধৃতি

Kullberg, Richard. Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII. SPIE Digital Library.