Han, S. Optical Metrology and Inspection for Industrial Applications V. SPIE Digital Library.
Chicago (17e ed.) BronvermeldingHan, Sen. Optical Metrology and Inspection for Industrial Applications V. SPIE Digital Library.
MLA (8e ed.) BronvermeldingHan, Sen. Optical Metrology and Inspection for Industrial Applications V. SPIE Digital Library.
Let op: Deze citaties zijn niet altijd 100% accuraat.