Micron and Submicron Integrated Circuit Metrology

Detalles Bibliográficos
Outros autores: Monahan, Kevin
Formato: Electrónico Libro
Idioma:English
Publicado: SPIE Digital Library, 1/2/86
Subjects:
Acceso en liña:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue
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040 |a BD-DhAAL  |c BD-DhAAL 
245 0 0 |h [electronic resource]  |a Micron and Submicron Integrated Circuit Metrology 
260 1 |b SPIE Digital Library,  |c 1/2/86 
300 |a 1 online resource 
500 |a <strong>On-Campus Access Only (IP based access)</strong> 
506 |a Electronic access restricted to authorized BRAC University faculty, staff and students 
538 |a Mode of access: Internet 
655 7 |a Conference papers and proceedings.  |2 Library of Congress 
700 1 |a Monahan, Kevin 
856 4 0 |z Full text available on Research4Life (SPIE Digital Library)  |u https://login.research4life.org/tacsgr1www_spiedigitallibrary_org/conference-proceedings-of-spie/0565