Yue, Y. Second International Conference on Testing Technology and Automation Engineering (TTAE 2022). SPIE Digital Library.
Chicago Style (17th ed.) CitationYue, Yang. Second International Conference on Testing Technology and Automation Engineering (TTAE 2022). SPIE Digital Library.
MLA (8th ed.) CitationYue, Yang. Second International Conference on Testing Technology and Automation Engineering (TTAE 2022). SPIE Digital Library.
Warning: These citations may not always be 100% accurate.