APA-referens (7:e uppl.)

Lowell, J. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.

Chicago-referens (17:e uppl.)

Lowell, John. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.

MLA-referens (8:e uppl.)

Lowell, John. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.

Varning: dessa hänvisningar är inte alltid fullständigt riktiga.