APA (7th ed.) Citation

Rao, G. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Rao, Gopal. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

MLA (8th ed.) Citation

Rao, Gopal. Microelectronic Manufacturing Yield, Reliability, and Failure Analysis. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.